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New official website launched.
We do appreciate each moment of your visit, please contact us for leaving your suggestion or comment. Thank you!

2016 / 05

06

NEWS - Product Demo & Performance Evaluation

The Intelligent Wafer Random Defect Inspection Platform is the world's
first and proven commercial GDS pattern based killer defect software platform
which delivers unprecedented breakthrough functions in radom defect solution.
Currently, we provide global customers with product demo and performance
evaluation services for Intelligent Wafer Random Defect Inspection Platform.
Don't miss out on experiencing the quantum leap of yield enhancement, please
contact us for more details.

【Read More】

2016 / 07

14

New official website launched.
We do appreciate each moment of your visit, please contact us for leaving your suggestion or comment. Thank you!

2016 / 05

06

News

AOE Lab, Inc.｜ Address: Rm. 53-509, No. 195, Sec. 4, Chung Hsing Rd., Chutung, Hsinchu, Taiwan 31040, R.O.C.｜TEL: +886-3-5910358 (Main Number)

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