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The Intelligent Wafer Random Defect Inspection Platform is the world's first and proven commercial GDS pattern based killer defect software platform which delivers unprecedented breakthrough functions in radom defect solution of the leading-edge semiconductor defect industry. Starting today, we provide global customers with product demo and performance evaluation services. Don't miss out on experiencing the quantum leap of yield enhancement, please contact us immediately for more details.

The Intelligent Wafer Random Defect Inspection Platform allows you accomplish your yield goal e.g. higher yield and shorten learning curve cycle time. We do believe that our innovative solution should be your Number One Choice of wafer random defect inspection tool in the fab.
We do understand what you have been looking for to enhance the yield in the fab, now, by using our tools the users are able to identify true failure killer defect much easier then ever.


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